Tight pitch wirings and capacitor(s)

ABSTRACT

The present disclosure relates to semiconductor structures and, more particularly, to tight pitch wirings and capacitors and methods of manufacture. The structure includes: a capacitor including: a bottom plate of a first conductive material; an insulator material on the bottom plate; and a top plate of a second conductive material on the insulator material; and a plurality of wirings on a same level as the bottom plate and composed of the second conductive material.

FIELD OF THE INVENTION

The present disclosure relates to semiconductor structures and, moreparticularly, to tight pitch wirings and capacitors and methods ofmanufacture.

BACKGROUND

Metal insulator metal (MIM) capacitors can be integrated with sub-etchwirings as known in the art, e.g., AlCu, TiN, W, Ta, or similar metalsused in integrated circuits. In such combination of structures, a bottomplate of the MIM capacitor and the sub-etch wiring are shared, i.e.,have the same metal material including thickness. However, difficultyarises in the patterning and etching of tight pitch wiring on the samelevel as the bottom plate of the MIM capacitor. This is due to the needfor a low resistance MIM bottom plate, especially when vias are not usedunder the MIM capacitor.

To form a low resistance MIM bottom plate, it needs to be maderelatively thick. There is also an inability to shrink sub-etch wiringheight since “thick” MIM bottom plates are required for the qualityfactor (Q). It is also not always possible to place vias under the MIMbottom plate, which would reduce its resistance, due to yield orreliability issues such as plasma charging damage.

SUMMARY

In an aspect of the disclosure, a structure comprises: a capacitorincluding: a bottom plate of a first conductive material; an insulatormaterial on the bottom plate; and a top plate of a second conductivematerial on the insulator material; and a plurality of wirings on a samelevel as the bottom plate and composed of the second conductivematerial.

In an aspect of the disclosure, a structure comprises: a metal insulatormetal (MIM) capacitor comprising a bottom plate, an insulator materialon the bottom plate; and a top plate on the insulator material; and aplurality of wirings composed of a same continuous stack as the topplate of the MIM capacitor.

In an aspect of the disclosure, a method comprises: depositing a firstconductive material on an underlying dielectric material; depositing aninsulator material on the first conductive material; patterning thefirst conductive material and the insulator material simultaneously toform a bottom plate and an insulator layer of a capacitor; depositing asecond conductive material on the insulator layer and the underlyingdielectric material; and patterning the second conductive material tosimultaneously form a top plate of the capacitor and a plurality ofwiring layers on the underlying dielectric material, wherein theplurality of wiring layers and the top plate and of a same stack.

BRIEF DESCRIPTION OF THE DRAWINGS

The present disclosure is described in the detailed description whichfollows, in reference to the noted plurality of drawings by way ofnon-limiting examples of exemplary embodiments of the presentdisclosure.

FIG. 1A shows a wafer with one or more metallized vias extendingdownwards from a top surface of the wafer to underlying wires, amongstother features, and respective fabrication processes in accordance withaspects of the present disclosure.

FIG. 1B shows a blanket deposition of a metal and dielectric material(insulator material), amongst other features, and respective fabricationprocesses in accordance with aspects of the present disclosure.

FIG. 2 shows a bottom plate and insulator layer of a MIM capacitor,amongst other features, and respective fabrication processes inaccordance with aspects of the present disclosure.

FIG. 3A shows a metal deposition layer that will form tight pitchwirings and a MIM capacitor top plate, and respective fabricationprocesses in accordance with aspects of the present disclosure.

FIG. 3B shows a top plate of the MIM capacitor and tight pitch wirings,amongst other features, and respective fabrication processes inaccordance with aspects of the present disclosure.

FIG. 4 shows interconnect and wiring structures connecting to the MIMcapacitor and the wirings, amongst other features, and respectivefabrication processes in accordance with aspects of the presentdisclosure.

DETAILED DESCRIPTION

The present disclosure relates to semiconductor structures and, moreparticularly, to tight pitch wirings and capacitors and methods ofmanufacture. More specifically, the present disclosure is directed totight pitch AlCu wirings and metal insulator metal (MIM) capacitorstructure(s). Advantageously, the present disclosure allows for tightpitch wirings which are etched after tight pitch wiring metaldeposition, compared to after the deposition of an insulator (e.g.,nitride deposition) and top plate metal deposition/etching processes forthe MIM capacitor. This allows for thinning of the tight pitch wiring(s)to tighten the pitch without degrading the MIM quality factor (Q) due toa thin bottom plate of the MIM capacitor. In addition, a lack ofdielectric material or dielectric material and metal (e.g., Ti layers ofthe MIM capacitor) on the tight pitch wirings allows for reduced pitchsince the maximum metal etch aspect ratio includes the nitride and otherlayers, such as Ti layers.

In embodiments, methods of fabricating the tight pitch wirings and MIMcapacitor(s) replace many conventional processing steps of the MIMcapacitor. Illustratively, the methods of fabrication no longer require,e.g., deposition of metal/nitride/metal ormetal/Ti/nitride/metal+pattern/etch+pattern/etch stack with metaldeposition+pattern/etch+metal deposition+metal pattern/etch fabricationprocesses. Instead, in embodiments, the processes described herein willform the top capacitor plate and the tight pitch wirings in a same metaldeposition and patterning process. For example, the bottom plate andinsulator material of the MIM capacitor are first deposited andpatterned, followed by the simultaneous deposition and patterning of thetop plate of the MIM capacitor and tight pitch wirings.

By implementing the processes herein, the top plate of the MIM capacitorand tight pitch wirings are the same continuous stack but are formed atthe same metal stack and the MIM bottom plate is formed from a differentmetal stack than the tight pitch wirings. That is, the MIM top plate andadjacent wirings are formed simultaneously from a same metal deposition,but at a different level. Also, the bottom plate of the MIM capacitorcould be formed from a different metal layer than the MIM top plate andwirings so that the Q factor for the MIM capacitor is not degraded ifthe tight pitch wiring thickness is reduced. In other words, the bottomplate of the MIM capacitor can be formed as tall or as thick asrequired, without regard to the wirings on the same level.

In addition, the MIM capacitor and the tight pitch wirings can be spacedapart, e.g., about 30 μm apart; although other dimensions are alsocontemplated herein. More specifically, the tight pitch wirings arespaced away from the bottom plate of the MIM capacitor that is formedprior to the tight pitch wirings. One possible equation used for spacingof the MIM capacitor and tight pitch wirings can be:30 microns*thickness of MIM bottom plate/(2×min critical dimension oftight pitch wire)

For example, using the above equation the spacing for 130 nm generationdevice can be calculated as follows: 30 microns*0.28 micron/(2×0.20micron)=21 microns. Spacing the MIM bottom plate and tight pitch wiringsis needed if the photoresist that is used to pattern the tight pitchwiring has greater thickness due to it being thicker over the MIM bottomplate, due to imperfect planarization of the photoresist. It isdesirable to have the same thickness tight pitch wiring photoresist inareas away from the MIM, to avoid having different resist thicknesses,which can cause problems with exposing and printing the photoresist.

The tight pitch wirings and capacitor(s) of the present disclosure canbe manufactured in a number of ways using a number of different tools.In general, though, the methodologies and tools are used to formstructures with dimensions in the micrometer and nanometer scale. Themethodologies, i.e., technologies, employed to manufacture the tightpitch wiring and capacitor structures of the present disclosure havebeen adopted from integrated circuit (IC) technology. For example, thestructures are built on wafers and are realized in films of materialpatterned by photolithographic processes on the top of a wafer. Inparticular, the fabrication of the tight pitch wirings and capacitor(s)use three basic building blocks: (i) deposition of thin films ofmaterial on a substrate, (ii) applying a patterned mask on top of thefilms by photolithographic imaging, and (iii) etching the filmsselectively to the mask.

FIG. 1A shows a wafer 14 with one or more metallized vias 12 extendingdownwards from a top surface of the wafer 14 to underlying wires 112.More specifically, the structure 10 of FIG. 1A shows an optional wiring112 and interconnect structure 12 embedded in an underlying insulatormaterial 14. In embodiments, the insulator material 14 can be anyinsulator material such as, e.g., SiO₂. The optional wiring 112 andinterconnect structure 12 can be formed by conventional lithography,etching and deposition processes known to those of skill in the art suchthat no further explanation is required herein for a completeunderstanding of the present disclosure.

FIG. 1B shows the deposition of the metal 16 and dielectric material(insulator material) 18 that will eventually form the MIM bottom plateand insulator layer of the MIM capacitor as shown in FIG. 2. Inembodiments, the metal 16 can be, for example, a combination of a lowresistance metal such as AlCu cladded above and below with thinnerlayers of refractory metals such as TiAl₃, TiN, Ti, W, Ta, or TaN;although other conductive material is also contemplated herein as isknown in the art. The insulator material 18 can be a nitride material,for example. Moreover, further dielectrics to form the MIM capacitor caninclude, for example and by way of non-limiting illustration, SiO₂, SiN,Ta₂O₅, Al₂O₃, etc. as known in the art.

As should be understood, the metal 16 and the insulator material 18 areformed by conventional deposition processes. For example, the metal 16and the insulator material 18 can be deposited using a conventionalphysical vapor deposition (PVD), chemical vapor deposition (CVD), atomiclayer deposition (ALD), or other process as known in the art.

FIG. 2 shows a bottom plate and insulator layer of a MIM capacitor,amongst other features, and respective fabrication processes inaccordance with aspects of the present disclosure. The bottom plate 16 aand insulator layer 18 a of the MIM capacitor are formed on theinsulator material 14. In embodiments, the bottom plate 16 a is formedfrom the metal layer 16 and the insulator layer 18 a is formed from theinsulator material 18 both of which are shown in FIG. 1B.

As should be understood, following the deposition of the metal 16 andthe insulator material 18, the layers are subjected to lithography andetching processes to form the bottom plate 16 a and the insulator layer18 a of the MIM capacitor. For example, the bottom plate 16 a and theinsulator material 18 a can be deposited using a conventional physicalvapor deposition (PVD), chemical vapor deposition (CVD), atomic layerdeposition (ALD), or other process as known in the art, followed bylithography and etching processes. In embodiments, the bottom plate 16 acan have a thickness (also referred to as height) of about 0.5 microns;although other dimensions are contemplated herein depending the designparameters, e.g., types of materials used and/or performancerequirements. The insulator material 18 a can have a thickness of about0.02 to 0.2 microns; although other dimensions are contemplated hereindepending the design parameters, e.g., types of materials used and/orperformance requirements as known in the art to form MIM capacitors.

The lithography and etching processes to form the bottom plate 16 a andthe insulator material 18 a comprise a resist formed over the insulatormaterial 18 of FIG. 1B, which is exposed to energy (light) to form apattern (opening). An etching process with a selective chemistry, e.g.,reactive ion etching (RIE), will be used to form the pattern of thebottom plate 16 a and the insulator material 18 a of the MIM capacitor.In embodiments, more than one bottom plate 16 a and insulator material18 a can be patterned to form more than one MIM capacitor. The resistcan be removed by a conventional ashing process using, for example,oxygen or oxygen and CF₄, or other known stripants.

FIG. 3A shows a metal deposition layer 25 that will form the tight pitchwiring and the MIM capacitor top plate as shown in FIG. 3B. This metallayer 25 will also deposit on the side of the MIM lower plate (bottomplate) 16 a. If the metal deposition is not conformal, the sidethickness of the metal layer 25 could be less than the thickness overthe planar wafer, itself, or the thickness over the MIM bottom plate 16a.

By way of example, the metal material 25 is blanket deposited over theinsulator material 18 a and the insulator material 14, and optionally incontact with the underlying wiring 112 and interconnect structure 12.The deposition process can be, e.g., a PVD, CVD, ALD, etc., process,which deposits the metal material 25 to a thickness (also referred to asheight) of about 0.25 microns; although other dimensions are alsocontemplated herein. For example, the metal material 25 can be depositedto the same thickness or less as the bottom plate 16 a of the MIMcapacitor. By having a single deposition process, the thickness andmetal stack of the top plate 20 and the tight pitch wirings 24 as shownin FIG. 3B will be the same, thereby decoupling the height of thewirings from the height of the bottom plate 16 a.

In addition, it is contemplated that the metal material 25 could be adifferent conductive material than the bottom plate 16 a of the MIMcapacitor, more preferably used for the wirings 24 as shown in FIG. 3B.As a non-limiting embodiment, the metal material for the top plate 20and the tight pitch wirings 24 can be, e.g., AlCu cladded withrefractory metals such as Ti, TiAl₃, TiN, W, Ta, TaN, etc.

FIG. 3B shows a top plate 20 of the MIM capacitor 22 and tight pitchwirings 24 and respective fabrication processes formed from the metaldeposition layer 25 shown in FIG. 3A. As shown in FIG. 3B, the top plate20 and the tight pitch wirings 24 are formed in the same deposition andpatterning processes. In this way, the metal material (metal material 25shown in FIG. 3A) used for the wirings 24 can be decoupled from thebottom plate 16 a of the MIM capacitor 22. For example, the metalmaterial 25 that was blanket deposited over the insulator material 18 aand the insulator material 14, and optionally in contact with theunderlying wiring and interconnect structure 12 can be patterned to formthe top plate 20 and the tight pitch wirings 24.

More specifically, following the deposition of the metal material 25,lithography and etching processes are performed to pattern the metalmaterial into the top plate 20 and the tight pitch wirings 24. Thebottom plate 16 a and the tight pitch wirings 24 can be spaced apartfrom one another, e.g., 30 microns; although different spacing iscontemplated herein depending on the technology node. In embodiments,the etching will also result in a spacing (pitch) between the wirings 24of about half the metal thickness, e.g., 0.12 microns if the metalthickness is about 0.25 microns; although different spacing (pitches) iscontemplated herein depending on the technology node ranging roughlyover a thickness range of 50 nm to 1 micron. As further shown in FIG.3B, one of the wirings 24 remain in contact with the underlying wiringand interconnect structure 12, after the etching process.

FIG. 3B further shows an optional spacer 26 on one or any combination ofsides of the bottom plate 16 a of the MIM capacitor 22. In embodiments,the spacer 26 is preferably the metal material used for the top plate 20and tight pitch wirings 24, which can be formed in the same depositionand patterning processes. For example, after the deposition of the metalmaterial, the spacer will be formed during the etching step (with anappropriate mask) so that it remains on one or any combination of thesidewalls of the bottom plate 16 a. In this way, the bottom plate 16 aand top plate 20 are composed of two different metal materials. Themetal spacer material 26 could be formed if the metal etch process wasanisotropic, such that the metal etched faster in the 0 degree regionsof the wafer above the tight pitch wiring 24 and MIM bottom plate 16 a.If an isotropic etching process was used, then this metal spacer 26material would not be present on the wafer.

FIG. 4 shows additional wirings and interconnect (via) structures to theMIM capacitor 22 and the wirings 24. More specifically, wiring andinterconnect structure 28 a is in direct contact with and electricallyconnected to one of the tight pitch wirings 24; whereas, wiring andinterconnect structure 28 b is in direct contact with and electricallyconnected to the bottom plate 16 a and the wiring and interconnectstructure 28 c is in direct contact with and electrically connected tothe top plate 20 of the MIM capacitor 22. In embodiments, the wiring andinterconnect structures 28 a, 28 b, 28 c are embedded and extend to atop surface of interlevel dielectric material 30, e.g., SiO₂. Note thatthe vias to both MIM plates 16 a, 20 may be used to avoid chargingdamage.

The interconnect structures can be formed by conventional lithography,etching and deposition processes. For example, after the deposition ofthe interlevel dielectric material 30, a resist formed over theinterlevel dielectric material 30 is exposed to energy (light) to form apattern (opening). An etching process with a selective chemistry, e.g.,RIE, will be used to form one or more vias in the interlevel dielectricmaterial 30 through the openings of the resist. The resist can then beremoved by a conventional oxygen ashing process or other knownstripants. Following the resist removal, conductive material isdeposited in the vias by any conventional deposition processes, e.g.,CVD processes. Any residual material on the surface of the interleveldielectric material 30 can be removed by conventional chemicalmechanical polishing (CMP) processes. The wiring structures can beformed by deposition and etching processes known to those of skill inthe art.

The method(s) as described above is used in the fabrication ofintegrated circuit chips. The resulting integrated circuit chips can bedistributed by the fabricator in raw wafer form (that is, as a singlewafer that has multiple unpackaged chips), as a bare die, or in apackaged form. In the latter case the chip is mounted in a single chippackage (such as a plastic carrier, with leads that are affixed to amotherboard or other higher level carrier) or in a multichip package(such as a ceramic carrier that has either or both surfaceinterconnections or buried interconnections). In any case the chip isthen integrated with other chips, discrete circuit elements, and/orother signal processing devices as part of either (a) an intermediateproduct, such as a motherboard, or (b) an end product. The end productcan be any product that includes integrated circuit chips, ranging fromtoys and other low-end applications to advanced computer products havinga display, a keyboard or other input device, and a central processor.

The descriptions of the various embodiments of the present disclosurehave been presented for purposes of illustration, but are not intendedto be exhaustive or limited to the embodiments disclosed. Manymodifications and variations will be apparent to those of ordinary skillin the art without departing from the scope and spirit of the describedembodiments. The terminology used herein was chosen to best explain theprinciples of the embodiments, the practical application or technicalimprovement over technologies found in the marketplace, or to enableothers of ordinary skill in the art to understand the embodimentsdisclosed herein.

What is claimed:
 1. A structure comprising: a capacitor comprising: abottom plate of a first conductive material; an insulator layer on thebottom plate; and a top plate of a second conductive material on theinsulator layer; and a plurality of wirings on a same level as thebottom plate, composed of a same continuous stack as the top plate ofthe capacitor, wherein both the bottom plate and the plurality ofwirings contact a same underlying insulator material.
 2. The structureof claim 1, wherein the plurality of wirings and the bottom plate arespaced apart by an interlevel dielectric material.
 3. The structure ofclaim 2, wherein the plurality of wirings and the bottom plate arespaced apart by about 30 microns.
 4. The structure of claim 1, whereinthe bottom plate and the plurality of wirings have a different height.5. The structure of claim 1, wherein the top plate and the plurality ofwirings have a same height.
 6. The structure of claim 5, wherein the topplate and the plurality of wirings are a same continuous stack formed atdifferent heights of the structure.
 7. The structure of claim 5, furthercomprising at least one sidewall spacer on a sidewall of the bottomplate and interlevel dielectric material separating the at least onesidewall spacer from the plurality of wirings.
 8. The structure of claim7, wherein the at least one sidewall spacer, the top plate and theplurality of wirings are of a same material.
 9. The structure of claim8, wherein the same material is AlCu.
 10. The structure of claim 1,wherein the first conductive material is different than the secondconductive material, and the second conductive material is AlCu.
 11. Astructure comprises: a metal insulator metal (MIM) capacitor comprisinga bottom plate, an insulator material on the bottom plate, and a topplate on the insulator material; a plurality of wirings on a sameunderlying insulator material as the bottom plate and composed of a samecontinuous stack as the top plate of the MIM capacitor, wherein thebottom plate and the plurality of wirings contact the same underlyinginsulator material; interlevel dielectric material separating theplurality of wires from one another and from the bottom plate of the MIMcapacitor; interconnect structures extending within the interleveldielectric material and contacting, from a top side, the top plate andthe bottom plate of the MIM capacitor and at least one of the pluralityof wirings; and one or more metallized vias contacting one of theplurality of wirings from a bottom side.
 12. The structure of claim 11,wherein the top plate and the plurality of wirings are formed atdifferent heights and of a same conductive material.
 13. The structureof claim 12, wherein the plurality of wirings are a same thickness asthe top plate.
 14. The structure of claim 12, wherein the plurality ofwirings are a different thickness than the bottom plate and formed of adifferent conductive material.
 15. The structure of claim 12, whereinthe plurality of wirings and the bottom plate are spaced apart.
 16. Thestructure of claim 12, further comprising at least one sidewall spaceron the bottom plate.
 17. The structure of claim 16, wherein the at leastone sidewall spacer, the top plate and the plurality of wirings are of asame material.
 18. The structure of claim 17, wherein the same materialis AlCu.
 19. The structure of claim 12, wherein the bottom plate and thetop plate are composed of different conductive materials.
 20. Thestructure of claim 1, further comprising: interlevel dielectric materialseparating the plurality of wires from one another and from the bottomplate; interconnect structures extending within the interleveldielectric material and contacting, from a top side, the top plate, thebottom plate and at least one of the plurality of wirings; and one ormore metallized vias contacting at least one of the plurality of wiringsfrom a bottom side.